Cohen κ (two raters)

cohen-kappa — agreement between two raters for categorical data, corrected for chance.

Statusvalidated
Version1.1.0
Minitab equivalentStat > Quality Tools > Attribute Agreement Analysis (paired appraisers)

Description

Cohen κ compares the observed agreement p_o with the chance agreement p_e derived from the marginal distributions. κ = 1 → perfect agreement, κ = 0 → chance, κ < 0 → worse than chance. Cornerstone of all kappa KPIs in Qprovement; MSA Type 5 computes it pairwise for every rater pair and it is the base for fleiss-kappa and weighted-kappa. The Fleiss/Cohen/Everitt (1969) SE approximation feeds a symmetric Wald confidence interval; the SE under H₀ gives the one-sided z-test for κ > 0.

Formulas

p_o
Observed agreement: proportion of cases on the cross-tabulation diagonal
p_e
Chance agreement derived from the observed marginal distributions
κ
Cohen kappa coefficient
SE(κ)
Standard error per Fleiss/Cohen/Everitt (1969)
95 %-KI
Symmetric Wald confidence interval
SE₀(κ)
Standard error under H₀ κ = 0 per Fleiss/Cohen/Everitt (1969); w̄_i· = Σ_j p_·j w_ij, w̄_·j = Σ_i p_i· w_ij, unweighted w = identity. Used for the test only, not for the CI
z, p
One-sided test of H₀ κ = 0 against κ > 0 (as in Minitab)

Assumptions

  • Two raters classify the same set of subjects on the same scale
  • Categorical ratings (binary or nominal); for ordinal scales weighted-kappa is more appropriate
  • Independent ratings (raters do not influence each other)

Limitations

  • κ is low when one class is rare, even under near-perfect agreement (kappa paradox)
  • The Wald CI relies on a large-sample approximation — CI edges are imprecise for very small N

References

  • Cohen, J. (1960) — A coefficient of agreement for nominal scales, Educational and Psychological Measurement 20(1)
  • Fleiss, J. L., Cohen, J. & Everitt, B. S. (1969) — Large sample standard errors of kappa and weighted kappa, Psychological Bulletin 72(5)
  • AIAG — Measurement Systems Analysis Reference Manual, 4th Edition (MSA-4), Kapitel III-C: Attribute Measurement Systems Study